报告2摘要：Strain and electromechanical coupling are ubiquitous in nature, and exist in many processes involved in information technology, energy conversion, and biological phenomena. Strain-based scanning probe microscopy (s-SPM) techniques, especially piezoresponse force microscopy (PFM) and electrochemical strain microscopy (ESM), have emerged as powerful tools to probe and manipulate materials, structures, and systems at the nanoscale. In this talk, we will present the fundamentals of s-SPM and a variety of its operational modes, introduce its applications in scientifically and technologically important functional materials, electrochemical systems, and biological structures, and discuss some of its challenges and potential opportunities. By detecting dynamic strains associated with underlying microscopic processes excited by a scanning probe, high sensitivity and unprecedented spatial resolution can be obtained, though caution must be exercised to distinguish different microscopic mechanisms, and quantitative interpretation of the s-SPM data remains challenging. We expect that s-SPM will continue to provide great insight into functional materials and structures, and will play a valuable role in the emerging field of materiomics.
报告人简介：李江宇，华盛顿大学机械工程学院教授。1994年毕业于清华大学材料科学与工程系，获得学士学位。1998年于科罗拉多大学机械工程学院获得博士学位。2001年，他在圣地亚哥加州大学和加州理工学院完成了博士后研究，随后作为助理教授加入内布拉斯加林肯大学。2006年，他加入华盛顿大学，并在2007年到2010年担任Bryan T.McMinn资助教授。已在多个顶级杂志上发表了大量论文，包括Science,NatureMaterials,PNAS和Physical Review Letters等。并获得ASME Sia-Nasser Early Career奖章，ICCES青年学者奖和ASME最佳论文奖等多个奖项。
